@Article{Rzepa2018,
Title     = {Comphy — A Compact-Physics Framework for Unified Modeling of BTI},
Author    = {G. Rzepa, J. Franco,  B. O’Sullivan,  A. Subirats, M. Simicic, G. Hellings, P. Weckx, M. Jech, T. Knobloch, M. Waltl, P. J. Roussel, D. Linten, B. Kaczer, and T. Grasser},
doi       = {https://doi.org/10.1016/j.microrel.2018.04.002},
Journal   = {Microelectronics Reliability},
Volume    = {85},
Pages     = {49--65},
year      = {2018},
publisher = {Elsevier}
}

@Article{Waldhoer2022,
Title     = {Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices},
Author    = {D. Waldhoer, C. Schleich, J. Michl, A. Grill, D. Claes, A. Karl, T. Knobloch, G. Rzepa, J. Franco, B. Kaczer, M. Waltl, T. Grasser},
doi       = {https://doi.org/10.48550/arXiv.2212.11547},
year      = {2022},
publisher = {arXiv}
}

@Article{Waldhoer2021,
Title     = {Toward Automated Defect Extraction From Bias Temperature Instability Measurements},
Author    = {D. Waldhoer, C. Schleich, J. Michl, B. Stampfer, K. Tselios, E. G. Ioannidis, H. Enichlmair,  M. Waltl, T. Grasser},
doi       = {https://doi.org/10.1109/TED.2021.3091966},
Journal   = {IEEE Transactions on Electron Devices},
Volume    = {68},
Issue     = {8}
Pages     = {4057--4063},
year      = {2021},
publisher = {IEEE}
}

@Article{Michl2021,
Title     = {Efficient Modeling of Charge Trapping at Cryogenic Temperatures—Part I: Theory},
Author    = {Jakob Michl, Alexander Grill, Dominic Waldhoer, Wolfgang Goes, Ben Kaczer, Dimitri Linten, Bertrand Parvais, Bogdan Govoreanu, Iuliana Radu, Michael Waltl, Tibor Grasser},
doi       = {https://doi.org/10.1109/TED.2021.3116931},
Journal   = {IEEE Transactions on Electron Devices},
Volume    = {68},
Issue     = {12}
Pages     = {6365--6371},
year      = {2021},
publisher = {IEEE}
}

@Article{Schleich2022,
Title     = {Single- Versus Multi-Step Trap Assisted Tunneling Currents—Part I: Theory},
Author    = {Christian Schleich, Dominic Waldhör, Theresia Knobloch, Weifeng Zhou, Bernhard Stampfer, Jakob Michl, Michael Waltl, Tibor Grasser},
doi       = {https://doi.org/10.1109/TED.2022.3185966},
Journal   = {IEEE Transactions on Electron Devices},
Volume    = {69},
Issue     = {8}
Pages     = {4479--4485},
year      = {2022},
publisher = {IEEE}
}

@Phdthesis{RzepaPhD,
Title     = {Efficient physical modeling of bias temperature instability},
Author    = {G. Rzepa},
doi       = {https://doi.org/10.34726/hss.2018.57326},
Type      = {Ph.D. Thesis},
School    = {TU Wien},
year      = {2018},
}